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6.

Muon-Induced Single Event Upsets in Deep-Submicron Technology
by Sierawski, Brian D

IEEE Transactions on Nuclear Science, December 2010, Vol.57(6), pp.3273-3278

7.

Electron-Induced Single-Event Upsets in Static Random Access Memory
by King, M. P

IEEE Transactions on Nuclear Science, December 2013, Vol.60(6), pp.4122-4129

9.

Selection of Well Contact Densities for Latchup-Immune Minimal-Area ICs
by Dodds, N A

IEEE Transactions on Nuclear Science, December 2010, Vol.57(6), pp.3575-3581

10.

Heavy Ion Testing With Iron at 1 GeV/amu
by Pellish, Jonathan A

IEEE Transactions on Nuclear Science, October 2010, Vol.57(5), pp.2948-2954

13.

TNT digital pulse processor
by Arnold, L

IEEE Transactions on Nuclear Science, June 2006, Vol.53(3), pp.723-728

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