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5.

The past and future of electronics testing [Trends in Future I&M]
by Ooi, Melanie

IEEE Instrumentation & Measurement Magazine, August 2018, Vol.21(4), pp.20-21

8.

Putting it to the test: IEC-1010-1

Journal of Business Ethics, Oct, 1995, Vol.14(10), p.113(3)

10.

Study on Whisker Growth on Solder Joints-Part I: Study on Acceleration Test Method
by Tsukui, Tsutomu

IEEE Transactions on Components, Packaging and Manufacturing Technology, August 2018, Vol.8(8), pp.1477-1486

13.

NDI of delamination in IC packages using millimeter-waves
by Ju, Yang

IEEE Transactions on Instrumentation & Measurement, August, 2001, Vol.50(4), p.1019(5)

14.

Introduction: The Best Papers of ISSTA
by Ryder, Barbara G

IEEE Transactions on Software Engineering, July 2010, Vol.36(4), pp.451-452

17.

Testability design prevents harm
by Ungar, Louis Y

IEEE Aerospace and Electronic Systems Magazine, March 2010, Vol.25(3), pp.35-43

18.

Self-Test Techniques for Crypto-Devices
by Di Natale, G

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, February 2010, Vol.18(2), pp.329-333

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