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Electron channeling contrast imaging of defects in III-nitride semiconductors
by Trager-Cowan, C.

Trager-Cowan, C., Naresh-Kumar, G., Allehiani, N., Kraeusel, S., Hourahine, B., Vespucci, S., Thomson, D., Bruckbauer, J., Kusch, G., Edwards, P. R., Martin, R. W., Mauder, C., Day, A. P., Winkelmann, A., Vilalta-Clemente, A., Wilkinson, A. J., Parbrook, P. J., Kappers, M. J., Moram, M. A., Oliver, R. A., Humphreys, C. J., Shields, P., Le Boulbar, E. D., Maneuski, D., O'Shea, V. and Mingard, K. P., 2014. Electron channeling contrast imaging of defects in III-nitride semiconductors. Microscopy and Microanalysis, 20 (3), pp. 1024-1025.

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