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A median run length-based double-sampling Xbar chart with estimated parameters for minimizing the average sample size

International audience

Journal Title: International journal of advanced manufacturing technology 2015, Vol.80 (1-4), p.411-426
Main Author: Teoh, Wei Lin
Other Authors: KHOO, Michael B.C , Castagliola, Philippe , Chakraborti, Subha
Format: Electronic Article Electronic Article
Language: English
Subjects:
Publisher: Springer Verlag
ID: ISSN: 0268-3768
Link: https://hal.archives-ouvertes.fr/hal-01185340
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recordid: cdi_hal_primary_oai_HAL_hal_01185340v1
title: A median run length-based double-sampling Xbar chart with estimated parameters for minimizing the average sample size
format: Article
creator:
  • Teoh, Wei Lin
  • KHOO, Michael B.C
  • Castagliola, Philippe
  • Chakraborti, Subha
subjects:
  • Statistics
ispartof: International journal of advanced manufacturing technology, 2015, Vol.80 (1-4), p.411-426
description: International audience
language: eng
source:
identifier: ISSN: 0268-3768
fulltext: no_fulltext
issn:
  • 0268-3768
  • 1433-3015
url: Link


@attributes
NO1
SEARCH_ENGINEprimo_central_multiple_fe
SEARCH_ENGINE_TYPEPrimo Central Search Engine
RANK2.3138108
LOCALfalse
PrimoNMBib
record
control
sourceidhal_opena
recordidTN_cdi_hal_primary_oai_HAL_hal_01185340v1
sourceformatXML
sourcesystemPC
sourcerecordidoai_HAL_hal_01185340v1
originalsourceidFETCH-LOGICAL-c1534-e3acfd1926df2c360dd0931aba728ed7d44e409b447a9571bf00a2b8ab6b45f20
addsrcrecordideNpVkUtvFDEQhEcIpCyBH5CbrxxM2o_xzBxXERCkFVxA4ma1xz07RvOS7U1Cfj3eLBdOrS5Vfyp1VdWNgI8CoLlNAKIBDqLmptMdf3pV7YRWiqsiva52IE3LVWPaq-ptSr-L2wjT7qrTns3kAy4snhY20XLMI3eYyDO_ntxEPOG8TWE5sl8OI-tHjJk9hjwySjnMmItzw4gzZYqJDWtkc1jCHJ7PN3kkhg8U8UjsBVRGeKZ31ZsBp0Tv_83r6ufnTz_u7vnh-5evd_sD70WtNCeF_eBFJ40fZK8MeA-dEuiwkS35xmtNGjqndYNd3Qg3AKB0LTrjdD1IuK6-XbjrRguGSHaLJXP8Y1cM1i-UrSd_2uzjYMtLLCmJg--MkiBlrXVZXdc2yteARhldgB8uwBGn_1j3-4M9ayBEW6LDgyje5uLt45pSpMH2IWMO65IjhskKsOfq7KW6clnbc3X2Cf4Cvl6NEA
sourcetypeOpen Access Repository
isCDItrue
recordtypearticle
display
typearticle
titleA median run length-based double-sampling Xbar chart with estimated parameters for minimizing the average sample size
creatorTeoh, Wei Lin ; KHOO, Michael B.C ; Castagliola, Philippe ; Chakraborti, Subha
creatorcontribTeoh, Wei Lin ; KHOO, Michael B.C ; Castagliola, Philippe ; Chakraborti, Subha
descriptionInternational audience
identifier
0ISSN: 0268-3768
1EISSN: 1433-3015
2DOI: 10.1007/s00170-015-6949-x
languageeng
publisherSpringer Verlag
subjectStatistics
ispartofInternational journal of advanced manufacturing technology, 2015, Vol.80 (1-4), p.411-426
rightsDistributed under a Creative Commons Attribution 4.0 International License
lds50peer_reviewed
oafree_for_read
citedbyFETCH-LOGICAL-c1534-e3acfd1926df2c360dd0931aba728ed7d44e409b447a9571bf00a2b8ab6b45f20
orcidid0000-0002-9532-4029
links
openurl$$Topenurl_article
thumbnail$$Usyndetics_thumb_exl
backlink$$Uhttps://hal.archives-ouvertes.fr/hal-01185340$$DView record in HAL
search
creatorcontrib
0Teoh, Wei Lin
1KHOO, Michael B.C
2Castagliola, Philippe
3Chakraborti, Subha
title
0A median run length-based double-sampling Xbar chart with estimated parameters for minimizing the average sample size
1International journal of advanced manufacturing technology
descriptionInternational audience
subjectStatistics
issn
00268-3768
11433-3015
fulltextfalse
rsrctypearticle
creationdate2015
recordtypearticle
recordideNpVkUtvFDEQhEcIpCyBH5CbrxxM2o_xzBxXERCkFVxA4ma1xz07RvOS7U1Cfj3eLBdOrS5Vfyp1VdWNgI8CoLlNAKIBDqLmptMdf3pV7YRWiqsiva52IE3LVWPaq-ptSr-L2wjT7qrTns3kAy4snhY20XLMI3eYyDO_ntxEPOG8TWE5sl8OI-tHjJk9hjwySjnMmItzw4gzZYqJDWtkc1jCHJ7PN3kkhg8U8UjsBVRGeKZ31ZsBp0Tv_83r6ufnTz_u7vnh-5evd_sD70WtNCeF_eBFJ40fZK8MeA-dEuiwkS35xmtNGjqndYNd3Qg3AKB0LTrjdD1IuK6-XbjrRguGSHaLJXP8Y1cM1i-UrSd_2uzjYMtLLCmJg--MkiBlrXVZXdc2yteARhldgB8uwBGn_1j3-4M9ayBEW6LDgyje5uLt45pSpMH2IWMO65IjhskKsOfq7KW6clnbc3X2Cf4Cvl6NEA
startdate2015
enddate2015
creator
0Teoh, Wei Lin
1KHOO, Michael B.C
2Castagliola, Philippe
3Chakraborti, Subha
generalSpringer Verlag
scope
01XC
1BOBZL
2CLFQK
orcididhttps://orcid.org/0000-0002-9532-4029
sort
creationdate2015
titleA median run length-based double-sampling Xbar chart with estimated parameters for minimizing the average sample size
authorTeoh, Wei Lin ; KHOO, Michael B.C ; Castagliola, Philippe ; Chakraborti, Subha
facets
frbrtype5
frbrgroupidcdi_FETCH-LOGICAL-c1534-e3acfd1926df2c360dd0931aba728ed7d44e409b447a9571bf00a2b8ab6b45f20
rsrctypearticles
prefilterarticles
languageeng
creationdate2015
topicStatistics
toplevelpeer_reviewed
creatorcontrib
0Teoh, Wei Lin
1KHOO, Michael B.C
2Castagliola, Philippe
3Chakraborti, Subha
collection
0Hyper Article en Ligne (HAL)
1OpenAIRE (Open Access)
2OpenAIRE
jtitleInternational journal of advanced manufacturing technology
delivery
delcategoryRemote Search Resource
fulltextno_fulltext
addata
au
0Teoh, Wei Lin
1KHOO, Michael B.C
2Castagliola, Philippe
3Chakraborti, Subha
formatjournal
genrearticle
ristypeJOUR
atitleA median run length-based double-sampling Xbar chart with estimated parameters for minimizing the average sample size
jtitleInternational journal of advanced manufacturing technology
date2015
risdate2015
volume80
issue1-4
spage411
epage426
pages411-426
issn0268-3768
eissn1433-3015
abstractInternational audience
pubSpringer Verlag
doi10.1007/s00170-015-6949-x
orcididhttps://orcid.org/0000-0002-9532-4029
oafree_for_read