schliessen

Filtern

 

Bibliotheken

Analysis of Scanned Probe Images for Magnetic Focusing in Graphene

We have used cooled scanning probe microscopy (SPM) to study electron motion in nanoscale devices. The charged tip of the microscope was raster-scanned at constant height above the surface as the conductance of the device was measured. The image charge scatters electrons away, changing the path of e... Full description

Journal Title: Bhandari Sagar, Gil-Ho Lee, Philip Kim, and Robert M. Westervelt. 2017. “Analysis of Scanned Probe Images for Magnetic Focusingin Graphene.” Journal of Electronic Materials 46 (7) (February 21): 3837–3841. doi:10.1007/s11664-017-5350-y.
Main Author: Bhandari, Sagar
Other Authors: Lee, Gil-Ho , Kim, Philip , Westervelt, Robert M.
Format: Electronic Article Electronic Article
Language: English
Subjects:
ID: ISSN: 0361-5235 ; DOI: 10.1007/s11664-017-5350-y
Link: http://dx.doi.org/10.1007/s11664-017-5350-y
Zum Text:
SendSend as email Add to Book BagAdd to Book Bag
Staff View
recordid: dash1/33973827
title: Analysis of Scanned Probe Images for Magnetic Focusing in Graphene
format: Article
creator:
  • Bhandari, Sagar
  • Lee, Gil-Ho
  • Kim, Philip
  • Westervelt, Robert M.
subjects:
  • Scanning Probe Microscopy Theory
  • Ballistic Transport
  • Graphene
  • Simulation
  • Magnetic Focusing
  • Electron Trajectories
ispartof: Bhandari, Sagar, Gil-Ho Lee, Philip Kim, and Robert M. Westervelt. 2017. “Analysis of Scanned Probe Images for Magnetic Focusingin Graphene.” Journal of Electronic Materials 46 (7) (February 21): 3837–3841. doi:10.1007/s11664-017-5350-y.
description: We have used cooled scanning probe microscopy (SPM) to study electron motion in nanoscale devices. The charged tip of the microscope was raster-scanned at constant height above the surface as the conductance of the device was measured. The image charge scatters electrons away, changing the path of electrons through the sample. Using this technique, we imaged cyclotron orbits that flow between two narrow contacts in the magnetic focusing regime for ballistic hBN–graphene–hBN devices. We present herein an analysis of our magnetic focusing imaging results based on the effects of the tip-created charge density dip on the motion of ballistic electrons. The density dip locally reduces the Fermi energy, creating a force that pushes electrons away from the tip. When the tip is above the cyclotron orbit, electrons are deflected away from the receiving contact, creating an image by reducing the transmission between contacts. The data and our analysis suggest that the graphene edge is rather rough, and electrons scattering off the edge bounce in random directions. However, when the tip is close to the edge, it can enhance transmission by bouncing electrons away from the edge, toward the receiving contact. Our results demonstrate that cooled SPM is a promising tool to investigate the motion of electrons in ballistic graphene devices.
language: eng
source:
identifier: ISSN: 0361-5235 ; DOI: 10.1007/s11664-017-5350-y
fulltext: fulltext_linktorsrc
issn:
  • 0361-5235
  • 03615235
url: Link


@attributes
ID584934420
RANK0.07
NO1
SEARCH_ENGINEprimo_central_multiple_fe
SEARCH_ENGINE_TYPEPrimo Central Search Engine
LOCALfalse
PrimoNMBib
record
control
sourcerecordid1/33973827
sourceiddash
recordidTN_dash1/33973827
sourcesystemOther
pqid2074766782
galeid494760198
display
typearticle
titleAnalysis of Scanned Probe Images for Magnetic Focusing in Graphene
creatorBhandari, Sagar ; Lee, Gil-Ho ; Kim, Philip ; Westervelt, Robert M.
ispartofBhandari, Sagar, Gil-Ho Lee, Philip Kim, and Robert M. Westervelt. 2017. “Analysis of Scanned Probe Images for Magnetic Focusingin Graphene.” Journal of Electronic Materials 46 (7) (February 21): 3837–3841. doi:10.1007/s11664-017-5350-y.
identifierISSN: 0361-5235 ; DOI: 10.1007/s11664-017-5350-y
subjectScanning Probe Microscopy Theory ; Ballistic Transport ; Graphene ; Simulation ; Magnetic Focusing ; Electron Trajectories
descriptionWe have used cooled scanning probe microscopy (SPM) to study electron motion in nanoscale devices. The charged tip of the microscope was raster-scanned at constant height above the surface as the conductance of the device was measured. The image charge scatters electrons away, changing the path of electrons through the sample. Using this technique, we imaged cyclotron orbits that flow between two narrow contacts in the magnetic focusing regime for ballistic hBN–graphene–hBN devices. We present herein an analysis of our magnetic focusing imaging results based on the effects of the tip-created charge density dip on the motion of ballistic electrons. The density dip locally reduces the Fermi energy, creating a force that pushes electrons away from the tip. When the tip is above the cyclotron orbit, electrons are deflected away from the receiving contact, creating an image by reducing the transmission between contacts. The data and our analysis suggest that the graphene edge is rather rough, and electrons scattering off the edge bounce in random directions. However, when the tip is close to the edge, it can enhance transmission by bouncing electrons away from the edge, toward the receiving contact. Our results demonstrate that cooled SPM is a promising tool to investigate the motion of electrons in ballistic graphene devices.
languageeng
source
version7
oafree_for_read
lds50peer_reviewed
links
openurl$$Topenurl_article
backlink$$Uhttp://dx.doi.org/10.1007/s11664-017-5350-y$$EView_record
linktorsrc$$Uhttp://nrs.harvard.edu/urn-3:HUL.InstRepos:33973827$$EView_full_text_in_Digital_Access_to_Scholarship_at_Harvard_(DASH)
openurlfulltext$$Topenurlfull_article
search
creatorcontrib
0Bhandari, Sagar
1Lee, Gil-Ho
2Kim, Philip
3Westervelt, Robert M.
titleAnalysis of Scanned Probe Images for Magnetic Focusing in Graphene
descriptionWe have used cooled scanning probe microscopy (SPM) to study electron motion in nanoscale devices. The charged tip of the microscope was raster-scanned at constant height above the surface as the conductance of the device was measured. The image charge scatters electrons away, changing the path of electrons through the sample. Using this technique, we imaged cyclotron orbits that flow between two narrow contacts in the magnetic focusing regime for ballistic hBN–graphene–hBN devices. We present herein an analysis of our magnetic focusing imaging results based on the effects of the tip-created charge density dip on the motion of ballistic electrons. The density dip locally reduces the Fermi energy, creating a force that pushes electrons away from the tip. When the tip is above the cyclotron orbit, electrons are deflected away from the receiving contact, creating an image by reducing the transmission between contacts. The data and our analysis suggest that the graphene edge is rather rough, and electrons scattering off the edge bounce in random directions. However, when the tip is close to the edge, it can enhance transmission by bouncing electrons away from the edge, toward the receiving contact. Our results demonstrate that cooled SPM is a promising tool to investigate the motion of electrons in ballistic graphene devices., Physics
subject
0Scanning probe microscopy theory
1ballistic transport
2graphene
3simulation
4magnetic focusing
5electron trajectories
general
0Digital Access to Scholarship at Harvard (DASH)
1Springer Nature
2English
310.1007/s11664-017-5350-y
sourceiddash
recordiddash1/33973827
issn
00361-5235
103615235
rsrctypearticle
creationdate2017
searchscopedash
scopedash
lsr30VSR-Enriched:[issue, eissn, vol, pqid, pages, galeid]
sort
titleAnalysis of Scanned Probe Images for Magnetic Focusing in Graphene
authorBhandari, Sagar ; Lee, Gil-Ho ; Kim, Philip ; Westervelt, Robert M.
creationdate20170000
facets
frbrgroupid6774854606944491140
frbrtype5
newrecords20171003
languageeng
creationdate2017
topic
0Scanning Probe Microscopy Theory
1Ballistic Transport
2Graphene
3Simulation
4Magnetic Focusing
5Electron Trajectories
collectionDASH (Harvard Library)
prefilterarticles
rsrctypearticles
creatorcontrib
0Bhandari, Sagar
1Lee, Gil-Ho
2Kim, Philip
3Westervelt, Robert M
toplevelpeer_reviewed
delivery
delcategoryRemote Search Resource
fulltextfulltext_linktorsrc
addata
aulast
0Bhandari
1Lee
2Kim
3Westervelt
aufirst
0Sagar
1Gil-Ho
2Philip
3Robert M.
au
0Bhandari, Sagar
1Lee, Gil-Ho
2Kim, Philip
3Westervelt, Robert M.
atitleAnalysis of Scanned Probe Images for Magnetic Focusing in Graphene
date2017
risdate2017
issn0361-5235
genrearticle
ristypeJOUR
abstractWe have used cooled scanning probe microscopy (SPM) to study electron motion in nanoscale devices. The charged tip of the microscope was raster-scanned at constant height above the surface as the conductance of the device was measured. The image charge scatters electrons away, changing the path of electrons through the sample. Using this technique, we imaged cyclotron orbits that flow between two narrow contacts in the magnetic focusing regime for ballistic hBN–graphene–hBN devices. We present herein an analysis of our magnetic focusing imaging results based on the effects of the tip-created charge density dip on the motion of ballistic electrons. The density dip locally reduces the Fermi energy, creating a force that pushes electrons away from the tip. When the tip is above the cyclotron orbit, electrons are deflected away from the receiving contact, creating an image by reducing the transmission between contacts. The data and our analysis suggest that the graphene edge is rather rough, and electrons scattering off the edge bounce in random directions. However, when the tip is close to the edge, it can enhance transmission by bouncing electrons away from the edge, toward the receiving contact. Our results demonstrate that cooled SPM is a promising tool to investigate the motion of electrons in ballistic graphene devices.
pubSpringer Nature
doi10.1007/s11664-017-5350-y
issue7
volume46
pages3837-3841
eissn1543186X
oafree_for_read