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Hardness of hexagonal tungsten carbide crystals as a function of orientation

A new depth-sensing microhardness mapping system has been used to measure the variation in microhardness with applied load and orientation of WC crystals. The orientations of the individual crystals were measured using an electron backscatter diffraction (EBSD) technique. The WC crystals were ∼100μm... Full description

Journal Title: Acta Materialia October 2012, Vol.60(17), pp.6131-6143
Main Author: Roebuck, B
Other Authors: Klose, P , Mingard, K.P
Format: Electronic Article Electronic Article
Language: English
Subjects:
ID: ISSN: 1359-6454 ; E-ISSN: 1873-2453 ; DOI: 10.1016/j.actamat.2012.07.056
Link: http://dx.doi.org/10.1016/j.actamat.2012.07.056
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recordid: elsevier_sdoi_10_1016_j_actamat_2012_07_056
title: Hardness of hexagonal tungsten carbide crystals as a function of orientation
format: Article
creator:
  • Roebuck, B
  • Klose, P
  • Mingard, K.P
subjects:
  • Tungsten Carbide Single Crystals
  • Orientation Relationship
  • Microindentation
  • Mechanical Properties
  • Electron Backscatter Diffraction
  • Tungsten Carbide Single Crystals
  • Orientation Relationship
  • Microindentation
  • Mechanical Properties
  • Electron Backscatter Diffraction
  • Engineering
ispartof: Acta Materialia, October 2012, Vol.60(17), pp.6131-6143
description: A new depth-sensing microhardness mapping system has been used to measure the variation in microhardness with applied load and orientation of WC crystals. The orientations of the individual crystals were measured using an electron backscatter diffraction (EBSD) technique. The WC crystals were ∼100μm in size, embedded in a copper alloy matrix, to enable arrays of multiple microhardness indents to be implanted in each grain, thus generating good statistical validity for the results. It was found that the most significant effect on microhardness was the angle between the plane of measurement and either the basal or prism planes. A simple cosine rule, in line with resolved shear stresses, was used to correlate the data. The results are compared with previous studies using Knoop, Vickers and Berkovitch indenters, and some discussion is included of observed deformation around indentations using electron imaging associated with the EBSD technique.
language: eng
source:
identifier: ISSN: 1359-6454 ; E-ISSN: 1873-2453 ; DOI: 10.1016/j.actamat.2012.07.056
fulltext: fulltext
issn:
  • 1359-6454
  • 13596454
  • 1873-2453
  • 18732453
url: Link


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titleHardness of hexagonal tungsten carbide crystals as a function of orientation
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subjectTungsten Carbide Single Crystals ; Orientation Relationship ; Microindentation ; Mechanical Properties ; Electron Backscatter Diffraction ; Tungsten Carbide Single Crystals ; Orientation Relationship ; Microindentation ; Mechanical Properties ; Electron Backscatter Diffraction ; Engineering
descriptionA new depth-sensing microhardness mapping system has been used to measure the variation in microhardness with applied load and orientation of WC crystals. The orientations of the individual crystals were measured using an electron backscatter diffraction (EBSD) technique. The WC crystals were ∼100μm in size, embedded in a copper alloy matrix, to enable arrays of multiple microhardness indents to be implanted in each grain, thus generating good statistical validity for the results. It was found that the most significant effect on microhardness was the angle between the plane of measurement and either the basal or prism planes. A simple cosine rule, in line with resolved shear stresses, was used to correlate the data. The results are compared with previous studies using Knoop, Vickers and Berkovitch indenters, and some discussion is included of observed deformation around indentations using electron imaging associated with the EBSD technique.
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A new depth-sensing microhardness mapping system has been used to measure the variation in microhardness with applied load and orientation of WC crystals. The orientations of the individual crystals were measured using an electron backscatter diffraction (EBSD) technique. The WC crystals were ∼100μm in size, embedded in a copper alloy matrix, to enable arrays of multiple microhardness indents to be implanted in each grain, thus generating good statistical validity for the results. It was found that the most significant effect on microhardness was the angle between the plane of measurement and either the basal or prism planes. A simple cosine rule, in line with resolved shear stresses, was used to correlate the data. The results are compared with previous studies using Knoop, Vickers and Berkovitch indenters, and some discussion is included of observed deformation around indentations using electron imaging associated with the EBSD technique.

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A new depth-sensing microhardness mapping system has been used to measure the variation in microhardness with applied load and orientation of WC crystals. The orientations of the individual crystals were measured using an electron backscatter diffraction (EBSD) technique. The WC crystals were ∼100μm in size, embedded in a copper alloy matrix, to enable arrays of multiple microhardness indents to be implanted in each grain, thus generating good statistical validity for the results. It was found that the most significant effect on microhardness was the angle between the plane of measurement and either the basal or prism planes. A simple cosine rule, in line with resolved shear stresses, was used to correlate the data. The results are compared with previous studies using Knoop, Vickers and Berkovitch indenters, and some discussion is included of observed deformation around indentations using electron imaging associated with the EBSD technique.

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