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Quenching Studies in Bridgman-Grown Cd sub x Hg sub 1--x Te

Rapid quenching of crystals of Cd sub x Hg sub 1--x Te (CMT) while growing at the slow rates of the Bridgman process reveals the solid/liquid interface at the point of quenching. The shape and extent of these interfaces, revealed by etching longitudinally-cut sections, have been related to the resul... Full description

Journal Title: J. Cryst. Growth Sept. 1983, Vol.63(1), pp.154-164
Main Author: Capper, P
Other Authors: Gosney, J , Jones, C , Quelch, M
Format: Electronic Article Electronic Article
Language: English
Subjects:
Quelle: © ProQuest LLC All rights reserved
ID: ISSN: 0022-0248
Link: http://search.proquest.com/docview/23333881/?pq-origsite=primo
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title: Quenching Studies in Bridgman-Grown Cd sub x Hg sub 1--x Te
format: Article
creator:
  • Capper, P
  • Gosney, J
  • Jones, C
  • Quelch, M
subjects:
  • Cadmium Compounds
  • Crystal Growth
  • Mercury Compounds
  • Tellurides
  • Interfaces
  • Crystal Properties (MD)
ispartof: J. Cryst. Growth, Sept. 1983, Vol.63(1), pp.154-164
description: Rapid quenching of crystals of Cd sub x Hg sub 1--x Te (CMT) while growing at the slow rates of the Bridgman process reveals the solid/liquid interface at the point of quenching. The shape and extent of these interfaces, revealed by etching longitudinally-cut sections, have been related to the resulting radial composition variations as determined by infrared transmission measurements. In the singly-quenched crystals, features are seen at the interface which are believed to be diffusional boundary layers. Optical microscopy and electron microprobe analysis have been used to determine the thickness of these layers. The evidence suggests that melt stirring reduces the thickness as expected for diffusional boundary layers. 17 ref.--AA
language: eng
source: © ProQuest LLC All rights reserved
identifier: ISSN: 0022-0248
fulltext: fulltext
issn:
  • 00220248
  • 0022-0248
url: Link


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titleQuenching Studies in Bridgman-Grown Cd sub x Hg sub 1--x Te
creatorCapper, P ; Gosney, J ; Jones, C ; Quelch, M
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ispartofJ. Cryst. Growth, Sept. 1983, Vol.63(1), pp.154-164
identifierISSN: 0022-0248
subjectCadmium Compounds ; Crystal Growth ; Mercury Compounds ; Tellurides ; Interfaces ; Crystal Properties (MD)
descriptionRapid quenching of crystals of Cd sub x Hg sub 1--x Te (CMT) while growing at the slow rates of the Bridgman process reveals the solid/liquid interface at the point of quenching. The shape and extent of these interfaces, revealed by etching longitudinally-cut sections, have been related to the resulting radial composition variations as determined by infrared transmission measurements. In the singly-quenched crystals, features are seen at the interface which are believed to be diffusional boundary layers. Optical microscopy and electron microprobe analysis have been used to determine the thickness of these layers. The evidence suggests that melt stirring reduces the thickness as expected for diffusional boundary layers. 17 ref.--AA
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descriptionRapid quenching of crystals of Cd sub x Hg sub 1--x Te (CMT) while growing at the slow rates of the Bridgman process reveals the solid/liquid interface at the point of quenching. The shape and extent of these interfaces, revealed by etching longitudinally-cut sections, have been related to the resulting radial composition variations as determined by infrared transmission measurements. In the singly-quenched crystals, features are seen at the interface which are believed to be diffusional boundary layers. Optical microscopy and electron microprobe analysis have been used to determine the thickness of these layers. The evidence suggests that melt stirring reduces the thickness as expected for diffusional boundary layers. 17 ref.--AA
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abstractRapid quenching of crystals of Cd sub x Hg sub 1--x Te (CMT) while growing at the slow rates of the Bridgman process reveals the solid/liquid interface at the point of quenching. The shape and extent of these interfaces, revealed by etching longitudinally-cut sections, have been related to the resulting radial composition variations as determined by infrared transmission measurements. In the singly-quenched crystals, features are seen at the interface which are believed to be diffusional boundary layers. Optical microscopy and electron microprobe analysis have been used to determine the thickness of these layers. The evidence suggests that melt stirring reduces the thickness as expected for diffusional boundary layers. 17 ref.--AA
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date1983-09-01