schliessen

Filtern

 

Bibliotheken

Scanning probe microscopy: characterization, nanofabrication and device application of functional materials : [proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002] / ed. by Paula Maria Vilarinho ...

PPN (Catalogue-ID): 482215755
Personen: Vilarinho, Paula Maria
Cooperations/Conferences: Advanced Study Institute on Scanning Probe Microscopy
Kongresse: NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials 2002.10.01-13 Albufeira
NATO ASI on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials 2002.10.01-13 Albufeira
ASI NATO Meeting on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials 2002.10.01-13 Albufeira
Format: Book Book
Language: English
Published: Dordrecht [u.a.], Kluwer Acad. Publ., 2005
Series: NATO science series Series 2, Mathematics, physics and chemistry (186)
Basisklassifikation: 33.68 Oberflächen Dünne Schichten Grenzflächen
50.94 Mikrosystemtechnik Nanotechnologie
51.45 Werkstoffe mit besonderen Eigenschaften
RVK:

UQ 4500: Physik -- Festkörperphysik -- Kristallographie -- Kristallphysik -- Kristalloptik, Polarisations- und auch Lichtmikroskopie von Kristallen

Subjects:

Werkstoffkunde

Rastersondenmikroskopie

Materials (Microscopy, Congresses)

Scanning probe microscopy (Congresses)

Kongress

Materials / Congresses / Microscopy

Scanning probe microscopy / Congresses

Kongress / Algarve <2002> / Werkstoffkunde / Rastersondenmikroskopie

Formangabe: Kongress, Algarve <2002>
Physical Description: XXXVII, 488 S, Ill., graph. Darst.
ISBN: 1-4020-3017-7
1-4020-3018-5
1-4020-3019-3

Similar Items

Vorhandene Hefte/Bände

more (+)

Informationen zur Verfügbarkeit werden geladen

Staff View
LEADER 04440nam a2200841 c 4500
001 482215755
003 DE-601
005 20170225092135.0
008 050323s2005 ne 000 0 eng d
020 |a 1402030177  |9 1-4020-3017-7 
020 |a 1402030185  |9 1-4020-3018-5 
020 |a 1402030193 (e-book)  |c No price  |9 1-4020-3019-3 
035 |a (OCoLC)254214343 
035 |a (OBV)AC04436503 
035 |a (DE-599)GBV482215755 
040 |b ger  |c GBVCP 
041 0 |a eng 
044 |a ne  |a xxu  |a xxk 
050 0 |a TA417.23 
082 0 0 |a 620.1/1 
084 |a 33.68  |9 Oberflächen  |9 Dünne Schichten  |9 Grenzflächen  |2 bkl 
084 |a 50.94  |9 Mikrosystemtechnik  |9 Nanotechnologie  |2 bkl 
084 |a 51.45  |9 Werkstoffe mit besonderen Eigenschaften  |2 bkl 
084 |a UQ 4500  |2 rvk 
084 |a 11  |2 ssgn 
245 0 0 |a Scanning probe microscopy: characterization, nanofabrication and device application of functional materials  |b [proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials, Algarve, Portugal, 1 - 13 October 2002]  |c ed. by Paula Maria Vilarinho ... 
264 3 1 |a Dordrecht [u.a.]  |b Kluwer Acad. Publ.  |c 2005 
300 |a XXXVII, 488 S.  |b Ill., graph. Darst. 
490 0 |a NATO science series  |a Series 2, Mathematics, physics and chemistry  |v 186 
650 7 |0 (DE-601)106075349  |0 (DE-588)4079184-1  |a Werkstoffkunde  |2 gnd 
650 7 |0 (DE-601)133215881  |0 (DE-588)4330328-6  |a Rastersondenmikroskopie  |2 gnd 
650 0 |a Materials  |x Microscopy  |v Congresses 
650 0 |a Scanning probe microscopy  |v Congresses 
650 7 |0 (DE-601)133215881  |0 (DE-588)4330328-6  |a Rastersondenmikroskopie  |2 gnd 
650 7 |0 (DE-601)104359463  |0 (DE-588)4130470-6  |a Kongress  |2 gnd 
653 0 |a Materials  |a Congresses  |a Microscopy 
653 0 |a Scanning probe microscopy  |a Congresses 
655 7 |a Kongress  |2 gnd 
655 7 |a Algarve <2002>  |2 gnd 
689 0 0 |A f  |a Kongress 
689 0 1 |A g  |a Algarve <2002> 
689 0 2 |A s  |0 (DE-601)106075349  |0 (DE-588)4079184-1  |a Werkstoffkunde 
689 0 3 |A s  |0 (DE-601)133215881  |0 (DE-588)4330328-6  |a Rastersondenmikroskopie 
689 0 |5 DE-101 
700 1 |a Vilarinho, Paula Maria 
710 2 |a Advanced Study Institute on Scanning Probe Microscopy  |d 2002  |c Albufeira  |0 (DE-601)482231726  |0 (DE-588)6039186-8 
711 2 |a NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials  |d 2002.10.01-13  |c Albufeira 
711 2 |a NATO ASI on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials  |d 2002.10.01-13  |c Albufeira 
711 2 |a ASI NATO Meeting on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials  |d 2002.10.01-13  |c Albufeira 
830 0 |w (DE-601)338766413  |w (DE-600)20645491  |a NATO science series / 2  |p NATO science series  |p NATO  |p 2000  |v 186  |9 18600 
856 4 2 |y Table of contents  |u http://www.loc.gov/catdir/toc/fy055/2005278733.html 
856 4 2 |y Publisher description  |u http://www.loc.gov/catdir/enhancements/fy0663/2005278733-d.html 
856 4 2 |u http://www.loc.gov/catdir/enhancements/fy0663/2005278733-d.html  |3 Verlagsangaben 
912 |a SYSFLAG_1 
912 |a GBV_GVK 
912 |a GBV_ILN_23 
912 |a GBV_ILN_40 
912 |a GBV_ILN_65 
912 |a GBV_ILN_70 
912 |a GBV_ILN_153 
912 |a GBV_ILN_65_a021 
951 |a BO 
980 |2 23  |1 01  |b 933600720  |f 28  |d 2833-7603  |x 0830  |y z  |z 06-05-09 
980 |2 40  |1 01  |b 715769561  |f BBP  |d ZL 000 = 2005 A 18900  |e u  |d 2005 A 18900  |x 7/15  |y xsn  |z 15-04-05 
980 |2 65  |1 01  |b 721245501  |f Ha 4  |d PH Handapparat Prof. Widdra 7.2.7.2 2005-102  |e g  |f Ha 4  |d UH 6320 104 a  |f Ha 4  |d PH 7.2.7.2 2005-102  |l Nach Rückgabe umsignieren  |x 3/4  |y za021  |z 01-08-05 
980 |2 65  |1 02  |b 800983602  |f Ha 4  |d UH 6320 104  |e u  |f Ha 4  |d PH 7.2.7.2 2006-284  |x 3/4  |y za021  |z 13-04-07 
980 |2 70  |1 01  |b 712897380  |d RS 1798(186)  |e f  |x 0089  |y z  |z 23-03-05 
980 |2 153  |1 01  |b 940678071  |f C.1.05  |d UH 6320 V687  |e i  |x 3315  |y z  |z 10-07-09 
983 |2 40  |1 00  |8 00  |0 (DE-601)619467932  |a ZL 000  |b Werkstoffkunde, Werkstoffprüfung, Werkstoffschutz {Technik} 
983 |2 40  |1 00  |8 01  |0 (DE-601)619466782  |a ZAO 000  |b Miniaturisierung {Technik} 
983 |2 40  |1 00  |8 02  |0 (DE-601)621338842  |a RPV 720  |b Mikroskopie {Physik} 
983 |2 65  |1 01  |8 00  |a 7.2.7.2 
998 |2 23  |1 01  |0 2009.06.25